Detecting and Deterring Plagiarism
Associated People
Associated Publications
- 2016: TAPS: A MOSS Extension for Detecting Software Plagiarism at Scale. Dana Sheahen & David Joyner. In Proceedings of the Third Annual ACM Conference on Learning @ Scale. Edinburgh, UK.
Associated Media
- Presentation: TAPS: A MOSS Extension for Detecting Software Plagiarism at Scale. The flipped presentation for the corresponding paper at Learning @ Scale 2016.
Associated News
- 25 Apr 2016: David, Dana, and Chaohua present at Learning @ Scale 2016. David Joyner, Dana Sheahen, and Chaohua Ou are in Edinburgh, Scotland presenting our five papers. All five presentations are part of the conference's flipped sessions, and the pre-recorded presentations are available here.
- 15 Apr 2016: Learning @ Scale Flipped Presentations Now Available. For our five Learning @ Scale papers, we are participating in a flipped session. This entails filming the presentation in advance. The presentations are open to the public and now available.
- 10 Feb 2016: Fifth Paper Accepted to Learning @ Scale 2016. "TAPS: A MOSS Extension for Detecting Software Plagiarism at Scale", co-authored by Dana Sheahen and David Joyner, has been accepted as a short paper to Learning @ Scale 2016. Congratulations, Dana and David!
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